Patent · US Expired

Method of making a semiconductor device

US4067100A · kind A · utility

6Cited by
2References
16Claims
0Family size

Inventors

Key dates

Filing dateAug 27, 1976
Grant dateJan 10, 1978
Priority date
Expiry dateAug 27, 1996

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31116
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of making a semiconductor device which has sharp corners on an upper surface and wherein a passivation layer is formed over said surface and windows are formed in the passivation layer for the attaching and formation of electrodes in which a photoresist material is placed over the passivation layer and selectively removed so as to leave areas of photoresist at locations over said passivation layer wherein electrodes are to be formed after which a layer of metal is formed over the surface and the metal and photoresist is removed at those portions where the photoresist layer remained after which passivation the area is etched through the windows in the metal layer and the metal layer is then removed and the electrodes are formed in the windows.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.