Patent · US Expired

Method for manufacturing semiconductor devices

US4073055A · kind A · utility

13Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 1977
Grant dateFeb 14, 1978
Priority date
Expiry dateFeb 22, 1997

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for the manufacture of semiconductor devices comprises the steps of forming a number of mutually electrically isolated semiconductor islands on an insulating substrate and cutting a semiconductor wafer, made of semiconductor elements and substrate, along its dicing line to provide a number of semiconductor chips, the method characterized in that additional semiconductor islands are formed on the insulating substrate simultaneously with, or after, the formation of the first-mentioned semi-conductor islands so that each substantially surrounds the chip. The method permits very easy mask alignments for photoengraving as well as a clear judgment as to whether or not the formation of contact openings has been completed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.