Patent · US Expired

Automatic single crystal diffractometer

US4074132A · kind A · utility

1Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 24, 1976
Grant dateFeb 14, 1978
Priority date
Expiry dateAug 24, 1996

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/207
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A diffractometer for acquiring crystallographic data from single crystal having means to mount the crystal in the path of a beam of x-rays, a moveable detector and means to constrain the detector to move on an arc which rotates about a horizontal axis so that the detector is sequentially positioned along a line of the reciprocal lattice of the crystal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.