Optical temperature measurement technique utilizing phosphors
US4075493A · kind A · utility
91Cited by
4References
23Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 16, 1976 |
| Grant date | Feb 21, 1978 |
| Priority date | — |
| Expiry date | Dec 16, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K1/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technique wherein an object or environment to be measured is provided with a phosphor material layer that emits at least two optically isolatable wavelength ranges whose intensity ratio depends upon the object or environment temperature. This technique is applied to remote hostile environment point temperature measurements, such as in large enclosed electrical power transformers and other large equipment, to the measurement of surface temperatures, such as in airplane structures being tested in wind tunnels, and elsewhere.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.