Patent · US Expired

Photovoltaic cell manufacture

US4082602A · kind A · utility

2Cited by
3References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 1977
Grant dateApr 4, 1978
Priority date
Expiry dateMay 2, 1997

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S136/29
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A quality control technique is based on the observation that trapping centers contribute to inefficient operation of junction devices. Devices are irradiated by a first radiation source of intensity sufficient to populate traps and a second radiation source of varying wavelength. Trapping centers are detected by a deviation from the expected photovoltaic output-incident wavelength relationship. Such "structure" is utilized as the basis for altering production conditions to minimize currents of such centers. While the procedure is of general applicability, it is particularly suitable as applied to photovoltaic cells.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.