High reliability epi-base radiation hardened power transistor
US4086610A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 28, 1974 |
| Grant date | Apr 25, 1978 |
| Priority date | — |
| Expiry date | Jun 28, 1994 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/953
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A high-voltage power transistor is hereinafter described which is able to withstand fluences as high as 3 .times. 10.sup.14 neutrons per square centimeter and still be able to operate satisfactorily. The collector may be made essentially half as thick and twice as heavily doped as normally and its base is made in two regions which together are essentially four times as thick as the normal power transistor base region. The base region has a heavily doped upper region and a lower region intermediate the upper heavily doped region and the collector. The doping in the intermediate region is as close to intrinsic as possible, in any event less than about 3 .times. 10.sup.15 impurities per cubic centimeter. The second base region has small width in comparison to the first base region, the ratio of the first to the second being at least about 5 to 1. The base region having the upper heavily doped region and the intermediate or lower low doped region contributes to the higher breakdown voltage which the transistor is able to withstand. The high doping of the collector region essentially lowers that portion of the breakdown voltage achieved by the collector region. Accordingly, it is necess…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.