Patent · US Expired

Method and apparatus for analyzing a time-dependent phenomenon

US4086652A · kind A · utility

7Cited by
3References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 19, 1977
Grant dateApr 25, 1978
Priority date
Expiry dateJan 19, 1997

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J3/453
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for analyzing a time-varying phenomenon in which the latter is repetitively initiated and a spectral output is generated during the course of each successive phenomenon. The output spectrum is repetitively scanned by a fast Fourier transform interferometer to produce an interferogram. The time relation between a selected retardation point in the interferometer and the initiation of each phenomenon is successively shifted so as to produce an ordered set of interferograms each representing a different time relation between initiation and scanning. Data corresponding to a selected temporal resolution element having a fixed time position following initiation of the phenomenon are selected from each of the ordered set of interferograms and the selected data are then reassembled in the same order as the interferograms from which they were taken, to produce a synthetic interferogram. The synthetic interferogram, when inversely transformed, provides the spectrum of the phenomenon as it appeared during that selected temporal resolution element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.