Radiation thickness gauge for sheet material
US4088886A · kind A · utility
7Cited by
2References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 27, 1976 |
| Grant date | May 9, 1978 |
| Priority date | — |
| Expiry date | Dec 27, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and method for measuring thickness of sheet material, particularly in a rolling mill, and controlling a roll stand. An X-ray florescence analyzer for determining the components of the sheet material, a radiation thickness gauge with a calibration system for gauging material of varying composition, and a computer for calculating a calibration signal for the thickness gauge based on the output of the analyzer, with the thickness gauge output providing a measure of the thickness of the sheet material at the gauge and a control signal for controlling the roll stand.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.