Device for measuring the thickness of layers with a radionuclide irradiating the layer

US4089054A · kind A · utility

Inventor

• Albert Ott · Niedernhausen, DE

Key dates

• Filing date: May 28, 1976
• Grant date: May 9, 1978
• Expiry date: May 28, 1996

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B15/02
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A normalized count from a digital computer in a layer-thickness measuring device of the beta ray back-scatter type, is fed to a digital-analog converter and a correction circuit which realizes the function X.sub.n corr = X.sub.n +A a.sub.2 X.sub.n.sup.p (1-x.sub.n).sup.q and then to an indicator having a non-linear scale, in which X.sub.n is the normalized count, A is a dimensionless number between +1 and -1, a.sub.2 is a dimensionless number between +0.1 and -0.1, and p and q are dimensionless positive values around unity but different from one another which are permanently wired into the correction circuit.