Single beam photometer for investigating a specimen
US4090792A · kind A · utility
8Cited by
2References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 22, 1976 |
| Grant date | May 23, 1978 |
| Priority date | — |
| Expiry date | Jun 22, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a single beam photometer the transmitted radiation is modulated in respect of wavelength. As the modulator, an interference pattern filter is used, whose transmitted wavelength agrees in the middle approximately with the absorption band to be measured. The interference pattern filter is either arranged so as to be rotatable in the beam path or oscillates at right angles to the optical axis. The electronic system is tuned to the first harmonic of the interference pattern filter frequency; i.e. the effects of signals of other frequencies are suppressed by the electronics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.