Method of and apparatus for recording surface irregularity of object
US4102578A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 13, 1976 |
| Grant date | Jul 25, 1978 |
| Priority date | — |
| Expiry date | Jan 13, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/306
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A slit image extending in the lateral direction of a travelling object is projected onto the surface of the object from one direction by means of a projection lens. The slit image formed on the object is then projected by means of an image focusing optical system onto a grid to make a light section moire element. The optical axis of the image focusing optical system is different from that of the projection lens employed in the slit image forming optical system. The light section moire element is enlarged in the lateral direction by means of a condenser lens and an anamorphic lens and focused on another slit. Behind the slit is located a film to record a line of light spots which represent the surface irregularity of the object. The film is fed in synchronization with the travel of the object so that the surface irregularities of the object may be recorded on the film in the form of contour lines.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.