Infrared source for use in an infrared gas detector
US4103174A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 13, 1976 |
| Grant date | Jul 25, 1978 |
| Priority date | — |
| Expiry date | Dec 13, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved gas analyzer for measuring the presence of one or more gaseous compounds in a gas sample. The gas analyzer has an infrared source stablized against temperature variations by a radiation loading scheme in combination with a selected source environmental temperature sensitivity to provide a stable source temperature without a conventional temperature controller. A rotating interference filter assembly is disposed in the optical path. This assembly alternately totally blocks radiation, passes radiation in a wave length band which will not be absorbed by a random gas sample, and sequentially passes radiation in one or more additional bands which will be absorbed by one or more gases in the sample cell. The sample cell features a unique enclosed cell with infrared transparent windows which are substantially free of impingement of contaminants of the gas sample thereon. A unique detector provides protection against deterioration from moisture while allowing easy and inexpensive assembly. The system electronics eliminates sensitivities to background radiation, contamination of windows, etc., and provides a self test capability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.