Multicontact test probe apparatus
US4112363A · kind A · utility
13Cited by
3References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 27, 1976 |
| Grant date | Sep 5, 1978 |
| Priority date | — |
| Expiry date | Dec 27, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test probe apparatus having a housing movable into engagement with a printed circuit device connected to a circuit board with a plurality of electrical contact members extending at various angles to the circuit board, and a plurality of contact probes mounted by said housing for engaging each of said contact members with a constant force insufficient to damage their connection to the circuit device, and a mounting device for holding the housing in engagement with the circuit device while attached to the printed circuit board.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.