Patent · US Expired

Automatic analysis apparatus

US4113436A · kind A · utility

54Cited by

8References

14Claims

0Family size

Assignee

Mettler Instrumente AG · CH

Inventors

Roger Daniel Werder · Möhlin, CH
Linus Meier · Saland, CH
Karl Lang · Berlin, DE

Key dates

Filing date	Feb 10, 1975
Grant date	Sep 12, 1978
Priority date	—
Expiry date	Feb 10, 1995

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T436/173845
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Operating stations of an automatic analysis apparatus are arranged along a path in which a specimen to be analyzed is moved in a container on a carrier. The specimen is transferred from the carrier to a container supporting platform of each station where it is to be processed, thereby permitting another specimen to by-pass the same station. Different sequences of operations may be performed simultaneously on several specimens without interfering with each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.