Patent · US Expired

Image analysis data extraction

US4115804A · kind A · utility

20Cited by
6References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 23, 1975
Grant dateSep 19, 1978
Priority date
Expiry dateMay 23, 1995

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/10016
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Techniques are disclosed for extracting measurement data from single or multiple fields of scan. Techniques are disclosed for obtaining alignment of data extracted from different fields of scan of the same image and for performing multiple fields of scan to extract data. Communication and control means are disclosed to permit the selection of a wide range of measurements using a keyboard and for the rapid presentation of data on a cathode ray tube display.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.