Apparatus for detecting a surface flaw of a material at high temperature
US4118732A · kind A · utility
20Cited by
7References
5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 15, 1977 |
| Grant date | Oct 3, 1978 |
| Priority date | — |
| Expiry date | Feb 15, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is an apparatus for detecting a surface flaw in hot metal including a particularly designed television camera, a shutter means and a control circuit which compensates the television camera's shading as well as the temperature difference among normal parts of the observed material. The apparatus makes it possible to conduct clear detection of a flaw on the surface of the hot material as it is so that yield loss at the time of scarfing can be avoided while heat energy can effectively be utilized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.