Patent · US Expired

Fail-safe or gate

US4125784A · kind A · utility

5Cited by
1References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 27, 1977
Grant dateNov 14, 1978
Priority date
Expiry dateJul 27, 1997

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/007
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A fail-safe "OR" logic gate circuit which includes at least a first and a second level detector each of which has a voltage breakdown device and an oscillating circuit, a separate resonant tank circuit each of which is tuned to substantially the same frequency and being loosely coupled between each other, an amplifying circuit coupled to the output of each oscillating circuit, and a regulating-rectifying circuit coupled to the output of the amplifying circuit and producing a d.c. output signal when a d.c. input signal causes either or both of the voltage breakdown devices to break down and to exhibit a low impedance for causing the respective oscillating circuits to oscillate and supply a.c. signals to the amplifying circuit for rectification by the regulating-rectifying circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.