Object support surface and method for X-ray examination
US4134019A · kind A · utility
3Cited by
3References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 22, 1977 |
| Grant date | Jan 9, 1979 |
| Priority date | — |
| Expiry date | Jul 22, 1997 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S428/902
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved object support surface for X-ray examinations and a method for carrying out such examinations whereby a source of X-rays is positioned above the surface and an X-ray image receptor is positioned below the surface. The support surface is a highly X-ray transparent and strong material comprised of a fibrous material held in a plastic matrix.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.