Repeat defect detector system
US4134684A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 18, 1977 |
| Grant date | Jan 16, 1979 |
| Priority date | — |
| Expiry date | Jan 18, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A flaw detection system is provided in which a source of radiation is scanned across a web of moving material being examined for repeat defects. The web is divided into lanes for processing purposes, and flaw information derived from the surface of material being examined is processed to provide a two-coordinate matrix location (lane and down-web), which is stored. This circuitry without the matrix outputs has other applications. Separation distances of a repeat flaw in the same lane are compared with a predetermined list, and if a match occurs, future flaw locations are projected in that lane. A repetition of a predetermined number of flaw repeats in a given lane signals an alarm. A predetermined number of misses in a row will result in the clearing of that lane of the particular flaw that failed to repeat.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.