Bi-axial probe
US4136458A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 1, 1976 |
| Grant date | Jan 30, 1979 |
| Priority date | — |
| Expiry date | Oct 1, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for measuring coordinate positions on an object by sensing a displacement of the stylus which contacts the object. The probe is responsive to forces which result from the contact between the object and the stylus to indicate coordinate positions of the object. The probe includes a replaceable stylus having a shank portion defining an axis, with a transversely-extending portion extending from the shank portion for sensing forces exerted by objects in the axial direction away from the probe, while the stylus shank portion is responsive to forces in the radial and axial (toward the probe) directions. The probe is thus responsive to forces exerted on the stylus in any direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.