Patent · US Expired

Device for the measurement of the wall thickness of tubes

US4137639A · kind A · utility

6Cited by
5References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 8, 1977
Grant dateFeb 6, 1979
Priority date
Expiry dateDec 8, 1997

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/068
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device for the measurement of the wall thickness of tubes, in particular for the measurement of extruded synthetic tubes during the extrusion process, comprises a common support for location within the tube and a plurality of measuring bodies mounted on the support and urged resiliently outwards for engagement with the tube wall. In order to provide a sufficiently robust support for the measuring bodies they are connected to the support by means of a parallelogram linkage, and in order to allow the measuring bodies a degree of free movement so that they can conform to the contour of the tube wall at least one parallelogram arm of the parallelogram linkage is pivoted with free play.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.