Patent · US Expired

Programmable probe fixture and method of connecting units under test with test equipment

US4138643A · kind A · utility

33Cited by
2References
41Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 10, 1977
Grant dateFeb 6, 1979
Priority date
Expiry dateJan 10, 1997

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07392
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A support houses a plurality of probes for guided movement relative to a printed circuit board unit under test fixedly mounted adjacent the support. Each probe is operatively associated with independent, pneumatically operated, piston and cylinder drive means for moving individual probes selected according to a predetermined program from a first retracted position to a second extended position. In the extended position only a continuous conductive path through the piston and cylinder is formed between the unit under test and an electrical interface for transmitting electronic signals therebetween. Several varieties of probes are provided for low and high frequency applications.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.