Arrangement for sensing the geometric characteristics of an object
US4145991A · kind A · utility
10Cited by
1References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 1977 |
| Grant date | Mar 27, 1979 |
| Priority date | — |
| Expiry date | Mar 14, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2536
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An arrangement for locating points on a surface, in which the surface is irradiated selectively and subdivided into a number of sections. The subdivided sections are made to overlap so that a region of one section overlaps the region of a neighboring section. Images of the irradiated sections are recorded, and then scanned for purposes of defining the location of predetermined points within overlapping regions of the subdivided sections. The location of the points within overlapping regions is dependent on a predetermined relationship of irradiated intensities of the points obtained during the scanning procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.