Method for checking gas analysis devices
US4151739A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 25, 1977 |
| Grant date | May 1, 1979 |
| Priority date | — |
| Expiry date | Apr 25, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/0006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for checking gas analysis devices in respect of their sensitivity and their response and regeneration behaviour with respect to time, wherein a reproducible quantity of the measurement component is produced at a predetermined production rate, for a period of time which is guided entirely or at a constant proportion as a concentration pulse to the measurement element of the gas analysis device. For the production of the measurement component a chemical or electro-chemical reaction or even a thermal reaction is used. The time interval can then be conveniently controlled. A decisive advantage with toxic measurement components is that the gas production takes place in all cases for only a short time during the test procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.