Patent · US Expired

Method for checking gas analysis devices

US4151739A · kind A · utility

20Cited by
6References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 25, 1977
Grant dateMay 1, 1979
Priority date
Expiry dateApr 25, 1997

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/0006
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for checking gas analysis devices in respect of their sensitivity and their response and regeneration behaviour with respect to time, wherein a reproducible quantity of the measurement component is produced at a predetermined production rate, for a period of time which is guided entirely or at a constant proportion as a concentration pulse to the measurement element of the gas analysis device. For the production of the measurement component a chemical or electro-chemical reaction or even a thermal reaction is used. The time interval can then be conveniently controlled. A decisive advantage with toxic measurement components is that the gas production takes place in all cases for only a short time during the test procedure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.