Elevation sampling terrain probe
US4158258A · kind A · utility
7Cited by
2References
25Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 24, 1978 |
| Grant date | Jun 19, 1979 |
| Priority date | — |
| Expiry date | Apr 24, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C7/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A surface contour sampling system is disclosed which intermittently measu the elevational irregularities in various and sundry surfaces, including those of the earth's terrain, model boards, and the like, with respect to a predetermined datum plane. A unique rotating bell crank and stepping surface sensing sampler combination permits the stepping upon and/or over large sloping or elevational changes by said surface sensing sampler, including those that are normal to the surface trend at any given location, without being stopped thereby, as it is moved forward along a predetermined path thereon by a suitable carrier vehicle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.