Laser measuring system for inspection
US4158507A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 27, 1977 |
| Grant date | Jun 19, 1979 |
| Priority date | — |
| Expiry date | Jul 27, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/254
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A laser measuring system for industrial inspection having a laser producing a narrow beam of coherent light which is focused by telescope onto an article. The focused beam of light from the telescope is directed by a scanning means across the article at a known rate. The light reflected from the article is focused by an imaging lens offset from the scanning means onto an optical grating which is provided with alternate transparent and opaque bars. The collected light which passes through the transparent bars of the optical grating is sensed by a photomultiplier detector. A processor which sees the output of the photomultiplier detector determines the time interval between selected points of the output signal of the photomultiplier detector. As the scanning beam moves across the article it causes the laser spot observed by the photomultiplier to traverse the surface faster or slower depending on whether the scanning is proceeding up a portion of the surface of the article or down, respectively. Thus, the reflected light traverses the optical grating at a slower or faster rate and, therefore, the time interval measured by the processor between the selected points on the output of the…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.