Arrangement for examining objects
US4163991A · kind A · utility
14Cited by
2References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 8, 1978 |
| Grant date | Aug 7, 1979 |
| Priority date | — |
| Expiry date | May 8, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/0081
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An arrangement for detecting foreign objects in products. The products are X-rayed to produce a quantized raster scanned signal. The samples thus obtained for each line are combined with the bit samples of the next line, shifted by at least one position, and the output signal is applied to an evaluation arrangement which supplies an alarm signal when a foreign object is present.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.