Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
US4164704A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 1976 |
| Grant date | Aug 14, 1979 |
| Priority date | — |
| Expiry date | Nov 1, 1996 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07328
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture for circuit cards comprising a probe board bearing electrical test probes in a fixed position with respect to the overlying test surface. A flexible sheet is supported by the probes and serves to stabilize their relative positions. The circuit card is held against the probes by vacuum force applied utilizing a thin plastic layer overlying the circuit card. The test probe utilized in the test fixture has a conductive shaft tapering to a cylindrical tip on which a conductive spring and a conductive contact cap are slidably mountable. The cap is tapered down to the tip, and the spring is designed to engage both the tapered portions of the cap and of the shaft. A twisting motion of the cap causes the spring to electrically and physically connect the cap and the shaft. The cap also an indentation for interlocking with the flexible sheet of the test fixture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.