Method and system for detection of thin metal layers in packaged articles
US4166973A · kind A · utility
9Cited by
8References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 7, 1978 |
| Grant date | Sep 4, 1979 |
| Priority date | — |
| Expiry date | Mar 7, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07C3/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Metal layers of extreme thinness, of the order of fifty Angstroms and greater are detected by use of microwave energy so propagated as to permit determination of the presence or absence of the metal in a detection zone of limited extent outwardly of the issuance location of such propagated energy. Apparatus is provided for propagating microwave energy having a characteristic which changes with propagation distance from a maximum value at the energy issuance location to a minimum value first exhibited at the outward end of the detection zone.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.