Multiple-level X-ray analysis for determining fat percentage
US4168431A · kind A · utility
26Cited by
3References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 6, 1978 |
| Grant date | Sep 18, 1979 |
| Priority date | — |
| Expiry date | Jan 6, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus is provided for determining in a non-destructive manner the quantities of components in a material having irregular surfaces and which may be of a non-uniform size and of a variable consistency. Three or more beams of polychromatic X-rays, each at a different level of energy, are passed through the material, and the measurements of each incident beam and each transmitted beam are utilized in determining the percentage of one or more of the components after having substantially eliminated so-called beam-hardening effects which otherwise limit the utility of polychromatic beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.