Patent · US Expired

Methods and apparatus for measuring the thickness of wet films

US4169319A · kind A · utility

7Cited by
3References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 6, 1978
Grant dateOct 2, 1979
Priority date
Expiry dateSep 6, 1998

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/066
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A gauge for measuring the thickness of a wet film on a surface comprises a circular disc having circumferentially spaced, calibrated notches around the outer periphery thereof. Finger grip elements are disposed at opposite sides of the disc and carry the disc for rotation relative thereto. The disc is rolled across the surface relative to the finger grip elements so that the notches are selectively wetted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.