Patent · US Expired

Circuit arrangement for time-dependent monitoring of the state of lines

US4176256A · kind A · utility

2Cited by

2References

5Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Albert Fruth · Germering, DE
Juergen Harenberg · Munich, DE

Key dates

Filing date	Jun 28, 1978
Grant date	Nov 27, 1979
Priority date	—
Expiry date	Jun 28, 1998

Classification

Technology area (CPC H)Electricity
CPC primaryH04Q3/00
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

Circuit arrangement for time-dependent monitoring of the condition of lines with a scanning device operating with the so-called "last-look" method, which recognizes condition alterations on the line and which produces a message supplemented by the address which corresponds with the scanned line. The time-dependent evaluation is obtained by comparing an adjustable theoretical time placed in a memory with an actual time formed by a counter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.