Patent · US Expired

Junction field effect transistor for use in integrated circuits

US4176368A · kind A · utility

23Cited by
1References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 10, 1978
Grant dateNov 27, 1979
Priority date
Expiry dateOct 10, 1998

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/401

Abstract

A junction field effect transistor is incorporated into a conventional monolithic bipolar integrated circuit using compatible processing steps. The transistor source and drain regions are produced during IC base diffusion and the gate contact during IC emitter diffusion. A channel is ion implanted in the region between source and drain. A second, shallower, opposite conductivity ion implant is applied over the channel so as to overlap and cover. Thus, a subsurface channel is created. A third ion implant of slightly deeper character and to a much heavier dosage is created in the region between and separated from the source and drain using an impurity of the same conductivity type as the second ion implant. This third ion implant is designed to span the channel without contacting either the source or drain, thus creating a top gate ohmically connected to the bottom gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.