Patent · US Expired

Image analysis data extraction

US4180831A · kind A · utility

4Cited by
2References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 3, 1977
Grant dateDec 25, 1979
Priority date
Expiry dateAug 3, 1997

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Techniques are disclosed for extracting measurement data from single or multiple fields of scan. Techniques are disclosed for obtaining alignment of data extracted from different fields of scan of the same image and for performing multiple fields of scan to extract data. Communication and control means are disclosed to permit the selection of a wide range of measurements using a keyboard and for the rapid presentation of data on a cathode ray tube display.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.