Process for the measurement of absolute values by means of a non-linearly working measured value emitter, and a measuring device for carrying out the process
US4181961A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 30, 1978 |
| Grant date | Jan 1, 1980 |
| Priority date | — |
| Expiry date | Jan 30, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D18/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a process for the measurement of absolute values by means of a non-linearly working measured value emitter, calibration of the measuring device is achieved by determining, for each of a range of measured values emitted, the corresponding absolute values, by means acting independently of the output signal of the measured value emitter, and storing each of the determined absolute values in a store at addresses defined by the measured value, and during a subsequent measuring process the store is interrogated by means of measured value information whereby the stored absolute values are determined. There is also described an apparatus for carrying out the process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.