Optical calibration apparatus and procedure
US4199816A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 28, 1978 |
| Grant date | Apr 22, 1980 |
| Priority date | — |
| Expiry date | Jun 28, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0221
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A process and apparatus for the calibration of an optical instrument. An optical instrument--such as a lens meter or ophthalmometer--is provided with a light source, a light detector, and an optical train of assembled optical elements therebetween. A suspect optical element to be measured is placed within the optical train at a measuring interval to deflect light passing along the optical train. An occulting moving boundary locus having at least two boundaries of differing shape, and a dedicated computer may be used to measure beam deflection. The dedicated computer also makes use of stored computer constants to transform raw measurements into the desired optical properties of the suspect optical element. The optical train of the instrument has its assembled optical elements randomly placed to production tolerances; precision registration of the optical elements to traditional close optical tolerances is omitted. Calibration occurs by manipulating the instrument's beam deflection apparatus under the control of a calibration program, by providing the optical instrument being calibrated with an umbilical cord which bypasses the central processing unit of the dedicated computer, but o…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.