Process and apparatus for the measurement of the factor of infra-red absorption or emission of materials
US4204120A · kind A · utility
7Cited by
2References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 22, 1978 |
| Grant date | May 20, 1980 |
| Priority date | — |
| Expiry date | May 22, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/0003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the absorptivity or emissivity factor of a sample at ambient temperature comprises maintaining a thermopile at a constant temperature substantially above ambient temperature and exposing the sample to radiation exclusively from the thermopile. The voltage across the thermopile is measured and provides a measure of the absorptivity or emissivity factor. The thermopile may be disposed in a temperature-controlled furnace extending into a conical cavity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.