Isotope analysis with a mass spectrometer using small samples
US4207465A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 3, 1978 |
| Grant date | Jun 10, 1980 |
| Priority date | — |
| Expiry date | Jul 3, 1998 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0027
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The difference in the concentration of a selected isotope in a first material and a second material, which may be a reference material, is measured by means of a mass spectrometer. The analysis is carried out with only a small amount of sample by introducing only a small slug of sample of the first material into the mass spectrometer by means of a sample valve. If there is a sufficient quantity of the second material, the first material my be compared directly to the second material. Direct comparison is also used when the second material is a reference material. If there is also only a small supply of the second material then the first material is compared to a reference material and in like manner the sample valve is utilized to supply a small sample of the second material to the mass spectrometer to be compared to the reference material. An indirect comparison of the first and second materials is thus provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.