Admittance sensing probe having multiple sensing elements
US4208909A · kind A · utility
20Cited by
5References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 24, 1978 |
| Grant date | Jun 24, 1980 |
| Priority date | — |
| Expiry date | Nov 24, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F23/268
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A single, elongated admittance sensing probe element comprises an elongated probe structure including a conductive level measuring probe electrode and a conductive composition probe electrode longitudinally spaced from the level measuring probe electrode closer to one end of the probe. A conductive shield extends between the level measuring and composition probe elements and beyond the composition probe element at the end of the probe. The entire structure is enclosed within an insulating material. In one embodiment, a cylindrical ground electrode or shield is mounted around the probe structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.