Circuit test clamp
US4210383A · kind A · utility
26Cited by
2References
4Claims
0Family size
Inventor
Key dates
| Filing date | Mar 7, 1979 |
| Grant date | Jul 1, 1980 |
| Priority date | — |
| Expiry date | Mar 7, 1999 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S439/912
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit test clamp for testing integrated circuit modules having a recess extending transversely across each body member exposing the conductive elements within them, and a projection extending outwardly from the eyelet disposed at one end of each conductive element, the base of the eyelet being embedded within its' body member, thereby permitting the simultaneous attachment of multiple leads from several test equipments and enhanced structural support of the eyelet.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.