Patent · US Expired

Insulated-gate semiconductor device

US4213140A · kind A · utility

10Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 6, 1978
Grant dateJul 15, 1980
Priority date
Expiry dateJul 6, 1998

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/601

Abstract

An insulated-gate semiconductor device wherein a first region is formed in the surface of a semiconductor substrate, the first region having a conductivity type opposite to that of the substrate, two insulated-gate FET's are formed within the first region, the drain of the first insulated-gate FET and that of the second insulated-gate FET are made common, the drains are electrically connected to the first region, and the gate of the first insulated-gate FET and the source of the second insulated-gate FET, and the gate of the second insulated-gate FET and the source of the first insulated-gate FET are respectively connected, thereby to prevent the occurrence of a negative resistance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.