Patent · US Expired

Interferometer for determining the shape of an object

US4222669A · kind A · utility

4Cited by
1References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 21, 1977
Grant dateSep 16, 1980
Priority date
Expiry dateNov 21, 1997

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/306
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention relates to an interferometric process, and particularly to a process for examining the planarity of surfaces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.