Patent · US Expired

Electrically reprogrammable non volatile memory

US4228527A · kind A · utility

32Cited by
0References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 1979
Grant dateOct 14, 1980
Priority date
Expiry dateFeb 22, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2216/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An electrically reprogrammable non-volatile memory device is disclosed which includes complementary MOS transistors provided with a polycrystalline silicon floating gate electrode in a common n.sup.- -type substrate. The device comprises three main parts. The first part, which is used for writing, comprises a p-channel writing transistor, a p-channel control transistor and a resistance element. The second part, which comprises a second gate electrode capacitance coupled with the floating gate, is used for erasing. The third part is used for performing information read-out and consists of a p-channel transistor the gate of which forms a portion of the floating gate and the drain of which is connected to a read-out terminal and to the terminal of a loading element having its other terminal connected to a negative supply potential. This device enables writing control to be performed using a logical signal of the order of one volt, read-out being also performed with a low voltage value, with low energy consumption. Erasure of information can be performed electrically and the retention time is of several years.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.