Optical scanning system with unwanted reflections controlled
US4234240A · kind A · utility
1Cited by
7References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 2, 1977 |
| Grant date | Nov 18, 1980 |
| Priority date | — |
| Expiry date | Feb 2, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B17/0888
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
This relates generally to optical systems, and one application of the invention is for reducing deleterious effects produced by surface reflections on lenses in thermal imaging systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.