Patent · US Expired

Semiconductor apparatus

US4235011A · kind A · utility

21Cited by
8References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 1979
Grant dateNov 25, 1980
Priority date
Expiry dateMar 28, 1999

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating a field-effect transistor device is provided with the device resulting having a relatively substantial capability to withstand reverse bias voltages. The device can also be provided having a relatively low "on" condition resistance between the source and drain terminals thereof by virtue of a geometrical design choice.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.