Patent · US Expired

Interferogram synthesization method and apparatus

US4238827A · kind A · utility

1Cited by
8References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 1978
Grant dateDec 9, 1980
Priority date
Expiry dateNov 20, 1998

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Real time presentation and evaluation of any selected interferogram is realized by electronically simulating optical aberration patterns and displaying them on a cathode ray tube (CRT). The optical aberration patterns include PISTON; X and Y TILT; DEFOCUS; SPHERICAL; COMA; and ASTIGMATISM. The aberration patterns are generated electronically in response to the CRT beam sweep drive signal and are displayed as a function of CRT beam intensity. Any combination of aberration patterns, each having selectable coefficients, can be displayed. The aberration pattern coefficient values are indicated by a digital readout. Evaluation of an unknown interferogram is accomplished by varying aberration pattern combinations and coefficients until a substantial match with the unknown interferogram is achieved. The contributing aberration patterns are then known and their magnitudes are determined from the digital read-out.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.