Patent · US Expired

Method of fabricating random access memory device

US4240845A · kind A · utility

18Cited by
11References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 4, 1980
Grant dateDec 23, 1980
Priority date
Expiry dateFeb 4, 2000

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/30
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A dynamic random access memory is fabricated on a monolithic chip of semiconductor material. The memory is formed of an array of memory cells controlled for reading and writing by word and bit lines which are selectively connected to the cells. Each cell is a single field effect transistor structure having improved electrical charge storage capability. The improved charge storage capability of each cell is provided by an electrical capacitance structure uniquely arranged and formed as an integral portion of the field effect transistor structure. The gate electrode of each field effect transistor structure is connected to a predetermined one of said word lines. The drain of each field effect transistor is connected to a predetermined one of said bit lines. The source of each field effect transistor structure is integrally connected to and forms a portion of the uniquely arranged electrical capacitance structure of the field effect transistor structure. The electrical capacitance or storage node structure of each cell has increased electrical charge storage capacity and may be considered as a single capacitor. The single (storage) capacitor of each cell is provided between the source…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.