Apparatus and method for integrated circuit test analysis
US4242635A · kind A · utility
51Cited by
2References
2Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 26, 1979 |
| Grant date | Dec 30, 1980 |
| Priority date | — |
| Expiry date | Jan 26, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/308
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.