Process and apparatus for analyzing a sample with the aid of pulsed laser irradiation
US4243887A · kind A · utility
12Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 1, 1979 |
| Grant date | Jan 6, 1981 |
| Priority date | — |
| Expiry date | May 1, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/718
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for analyzing a sample comprising the steps of irradiating a selected area of the sample with a first burst of laser energy to vaporize the sample, condensing the vaporized sample on the surface of an intermediate carrier and analyzing the condensed sample material deposited on the intermediate carrier.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.