Patent · US Expired

Process and apparatus for analyzing a sample with the aid of pulsed laser irradiation

US4243887A · kind A · utility

12Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 1, 1979
Grant dateJan 6, 1981
Priority date
Expiry dateMay 1, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/718
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for analyzing a sample comprising the steps of irradiating a selected area of the sample with a first burst of laser energy to vaporize the sample, condensing the vaporized sample on the surface of an intermediate carrier and analyzing the condensed sample material deposited on the intermediate carrier.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.