Patent · US Expired

MOS Random-access memory

US4247917A · kind A · utility

7Cited by
5References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 27, 1979
Grant dateJan 27, 1981
Priority date
Expiry dateAug 27, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/4094
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An MOS dynamic random-access memory (RAM) realizable as a 64K RAM is disclosed. Single transistor cells employing capacitive storage are coupled to folded bit-line halves. These bit-line halves are connected to sense amplifiers employing cross-coupled transistors. Boosting means employing a variable capacitance are coupled to the bit-line halves to boost the potential on a line during reading. The capacitor associated with each of the memory cells is coupled to a potential which is greater than the power supply potential. This plate potential is substantially constant and independent of power supply variations and is internally generated. The dummy cells employed within the RAM are charged in a unique manner to a substantially constant potential which does not vary with power supply variations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.